Technicians in charge: Maite Simón and Andrés Gómez
Scientist in charge: Martí Gich

Scientific & Technical Services

Scanning Probe Microscopy (SPM/AFM)

The Scanning Probe Microscopy (SPM) Lab provides state-of-the-art technologies that allow for the characterization of nanometric materials through the creation of reliable, fast and low cost topographic images as well as advanced modes.

Scientific equipment available

  • Keysight 5100 AFM: A 60x60x6 micron scanner that uses a special liquid cell and controlled chamber to develop scans at low humidity or in nitrogen. It is specifically employed to acquire topographic images with a low noise architecture.
  • Keysight 5500LS AFM: A 90x90x15 micron closed loop scanner with the following modes: Piezoresponse Force Microscopy, Electrostatic Force Microscopy, Kelvin Probe Force Microscopy, Scanning thermal Microscopy (from 2Q2016), Current Sensing Atomic Force Microscopy, PhotoConductive Atomic Force Microscopy, Bimodal Atomic Force Microscopy.
  • Keysight 5500 AFM: A 90x90x15 micron closed loop scanner with the following modes: Piezoresponse Force Microscopy, Bimodal Atomic Force Microscopy and Dynamic Topography.

Use of the Service in 2019

The service has processed 4,500 images during 2019, corresponding to 100 users: 80 % internal users, and 20 % external users belonging to different companies, and other research centers and universities. The service participated actively in the NFFA project.

Outreach, publications and projects in which the service has participated

The service has collaborated in many publications and projects, and is co-author of following publication: Ferroelectricity-free lead halide perovskites. Andrés Gómez, Qiong Wang, Alejandro R. Goñi, Mariano Campoy-Quiles and  Antonio Abate.  Energy Environ. Sci., 2019, 12, 2537-2547.

Coordination
Anna May-Masnou This email address is being protected from spambots. You need JavaScript enabled to view it.
Redaction
Anna May-Masnou This email address is being protected from spambots. You need JavaScript enabled to view it.
Web & Graphic Editor
José Antonio Gómez  This email address is being protected from spambots. You need JavaScript enabled to view it.

Webmasters
José Antonio Gómez This email address is being protected from spambots. You need JavaScript enabled to view it.
Albert Moreno     This email address is being protected from spambots. You need JavaScript enabled to view it.
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